My Library

     
Limit search to available items
Book Cover
EBOOK
Title Testing for small-delay defects in nanoscale CMOS integrated circuits / editors, Sandeep K. Goel, Krishnendu Chakrabarty.
Publication Info. Boca Raton : CRC Press, 2014.

Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOKS-DDA    AVAIL. ONLINE
Description 1 online resource.
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Note Description based on print version record.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Perth, W.A. Available via World Wide Web.
Note Description based on print version record.
Subject Metal oxide semiconductors, Complementary -- Testing.
Added Author Goel, Sandeep K., editor of compilation.
Chakrabarty, Krishnendu, editor of compilation.
Ebooks Corporation
Related To Original 9781439829417 1439829411 (DLC) 2013028538
ISBN 143982942X (electronic bk.)
9781439829424 (electronic bk.)
9781439829417 (hardcover : alk. paper)
1439829411 (hardcover : alk. paper)
OCLC # EBC1375195
View Shelf for Similar Items