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Title Testing for small-delay defects in nanoscale CMOS integrated circuits [electronic resource] / edited by Sandeep K. Goel, Krishnendu Chakrabarty.
Publication Info. Boca Raton : CRC Press, [2014]

Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOK-ELECTRICALENGINEERINGnetBASE    AVAIL. ONLINE
Description xv, 247 pages : illustrations ; 24 cm.
Series ENGnetBASE
ELECTRICALENGINEERING netBASE
Bibliography Includes bibliographical references (pages 215-222) and index.
Access License restrictions may limit access.
Subject Metal oxide semiconductors, Complementary -- Testing.
Added Author Goel, Sandeep K.
Chakrabarty, Krishnendu.
ENGnetBASE
ELECTRICALENGINEERING netBASE
ISBN 9781439829417 (hardcover : alk. paper)
OCLC # sseb_ssj0000955985
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