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Author Maricau, Elie.
Title Analog IC reliability in nanometer CMOS [electronic resource] / Elie Maricau, Georges Gielen.
Publication Info. New York, NY : Springer, c2013.
Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOKS-DDA    AVAIL. ONLINE
Description 1 online resource.
Series Analog circuits and signal processing series.
Contents Introduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Perth, W.A. Available via World Wide Web.
Subject Linear integrated circuits -- Reliability.
Metal oxide semiconductors, Complementary.
Engineering.
Electronics.
Systems engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Added Author Gielen, Georges.
Ebooks Corporation
ISBN 9781461461630 (electronic bk.)
1461461634 (electronic bk.)
9781461461623
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