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Title Analog IC reliability in nanometer CMOS [electronic resource] / Elie Maricau, Georges Gielen.
Publication Info. New York, NY : Springer, c2013.

Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOKS-DDA    AVAIL. ONLINE
Description 1 online resource.
Series Analog circuits and signal processing series.
Contents Introduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Perth, W.A. Available via World Wide Web.
Subject Linear integrated circuits -- Reliability.
Metal oxide semiconductors, Complementary.
Systems engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Added Author Gielen, Georges.
Ebooks Corporation
ISBN 9781461461630 (electronic bk.)
1461461634 (electronic bk.)
OCLC # EBC1106143
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