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Title Design, analysis and test of logic circuits under uncertainty [electronic resource] / Smita Krishnaswamy, Igor L. Markov, John P. Hayes.
Publication Info. Dordrecht : Springer, c2013.

Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOKS-DDA    AVAIL. ONLINE
Description 1 online resource.
Series Lecture notes in electrical engineering ; v. 115.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Perth, W.A. Available via World Wide Web.
Note Description based on online resource; title from digital title page (viewed on Oct. 22, 2012).
Subject Logic circuits -- Reliability -- Statistical methods.
Logic circuits -- Design and construction -- Statistical methods.
Logic circuits -- Testing -- Statistical methods.
Added Author Markov, Igor L. (Igor Leonidovich), 1973-
Hayes, John P. (John Patrick), 1944-
Ebooks Corporation
ISBN 9789048196449 (electronic bk.)
9048196442 (electronic bk.)
OCLC # EBC1030225
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