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Title Nanometer variation-tolerant SRAM [electronic resource] : circuits and statistical design for yield / Mohamed H. Abu-Rahma, Mohab Anis.
Publication Info. New York, NY : Springer, c2013.

Location Call No. Status Notes
 Libraries Electronic Books  ELECTRONIC BOOKS-DDA    AVAIL. ONLINE
Description 1 online resource.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Perth, W.A. Available via World Wide Web.
Subject Random access memory.
Computer aided design.
Systems engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Added Author Anis, Mohab.
Ebooks Corporation
ISBN 9781461417491 (electronic bk.)
146141749X (electronic bk.)
OCLC # EBC994313
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